| Original language | English |
|---|---|
| Article number | 8097094 |
| Pages (from-to) | iv |
| Journal | ITC-Asia 2017 - International Test Conference in Asia |
| DOIs | |
| Publication status | Published - 2017 Nov 3 |
| Event | 1st International Test Conference in Asia, ITC-Asia 2017 - Taipei, Taiwan Duration: 2017 Sep 13 → 2017 Sep 15 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Automotive Engineering
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
Cite this
Wu, C. W., Lee, K-J., Wang, L. C., & Huang, S. Y. (2017). Foreword. ITC-Asia 2017 - International Test Conference in Asia, iv. [8097094]. https://doi.org/10.1109/ITC-ASIA.2017.8097094
@article{162549b98d1d49b0ad46b8ed60aecfaf,
title = "Foreword",
author = "Wu, {Cheng Wen} and Kuen-Jong Lee and Wang, {Li C.} and Huang, {Shi Yu}",
year = "2017",
month = "11",
day = "3",
doi = "10.1109/ITC-ASIA.2017.8097094",
language = "English",
pages = "iv",
journal = "ITC-Asia 2017 - International Test Conference in Asia",
}
Wu, CW, Lee, K-J, Wang, LC & Huang, SY 2017, 'Foreword', ITC-Asia 2017 - International Test Conference in Asia, pp. iv. https://doi.org/10.1109/ITC-ASIA.2017.8097094
Foreword. / Wu, Cheng Wen; Lee, Kuen-Jong; Wang, Li C.; Huang, Shi Yu.
In: ITC-Asia 2017 - International Test Conference in Asia, 03.11.2017, p. iv.Research output: Contribution to journal › Editorial
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JO - ITC-Asia 2017 - International Test Conference in Asia
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Wu CW, Lee K-J, Wang LC, Huang SY. Foreword. ITC-Asia 2017 - International Test Conference in Asia. 2017 Nov 3;iv. 8097094. https://doi.org/10.1109/ITC-ASIA.2017.8097094