Abstract
Cu3Ge/Pt/Au has been deposited onto the surface of p-ZnSe, n+-ZnSe and n-ZnSe. It was found that the observed Cu3Ge/p-ZnSe ohmic behaviour is due mainly to hole tunnelling through the metal/semiconductor interface. A p+-n junction-like I-V characteristic for Cu3Ge/n-ZnSe was also observed. Furthermore, a negative differential resistance with a peak-to-valley ratio of approximately 6 was observed under forward bias when Cu3Ge was deposited onto n+-ZnSe. These observations all suggest that Cu3Ge can form a local p+ region on the ZnSe surface.
Original language | English |
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Pages (from-to) | 2231-2232 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 35 |
Issue number | 25 |
DOIs | |
Publication status | Published - 1999 Dec 9 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering