In this article, a quadtree element-free Galerkin method (QEFGM) is proposed for automatically configuring background cells. The QEFGM is then employed in the fracture analysis of a piezoelectric elliptical tube subjected to internal pressure and thermal loading. The stress intensity factor (SIF) is calculated by the QEFGM and the traditional element-free Galerkin method (EFGM). By investigating an internally cracked piezoelectric plate subjected to lateral tension, the error of SIF for the EFGM is 5.17%, and the QEFGM is 1.28% at the crack-to-length ratio (c/ W= 0.25 ). The results show that the error of QEFGM is one-fourth of EFGM, which demonstrates the correctness and superiority of the approach. The QEFGM was then employed in an examination of the system geometry on the SIF in a fractured piezoelectric tube. Fracture analysis was carried out for four ellipses with different axial ratios and three super-ellipses of different powers. The SIF increased with the axial ratio for the ellipses, and increased with the powers for the super-ellipses. In this paper, various physical characteristics analyses of fracture piezoelectric material were carried out under different structure geometries. The presented result is beneficial to the prediction of material life.
All Science Journal Classification (ASJC) codes
- Computational Mechanics
- Mechanical Engineering