Free-form curves contour error estimation using the backward arc length approach

Ke Han Su, Hung Ruey Chen, Ming-Yang Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In high-precision contour machining applications, large contour error is an indication of poor machining accuracy. As such, many sophisticated control algorithms have been proposed to reduce contour error, with the overall goal of improving contouring accuracy. Many algorithms focus on developing the decoupling control laws for improving contouring accuracy, while others aim to improve tracking performance so as to reduce contour error. In particular, several previous studies emphasize on developing contour error estimation approaches which generate the accurate contour error estimation needed in contouring controllers. Generally, accurate contour error estimation facilitates the efficiency of the contouring controller. This paper proposes a modified parameter-based contour error estimation approach for obtaining accurate contour error estimation. In the proposed approach, the approximated arc length is used as a backward distance, assuring the estimated reference point will be close to the actual cutting point. Consequently, the contour error can be accurately estimated. Moreover, the Cross-Coupled Controller (CCC) scheme is employed to further improve the contouring accuracy of biaxial contour following tasks. To assess the performance of the proposed approach, several free-form contour following experiments have been conducted. Experimental results verify the effectiveness of the proposed approach.

Original languageEnglish
Title of host publication2014 IEEE/SICE International Symposium on System Integration, SII 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages269-274
Number of pages6
ISBN (Electronic)9781479969449
DOIs
Publication statusPublished - 2014 Jan 30
Event7th IEEE/SICE International Symposium on System Integration, SII 2014 - Tokyo, Japan
Duration: 2014 Dec 132014 Dec 15

Publication series

Name2014 IEEE/SICE International Symposium on System Integration, SII 2014

Other

Other7th IEEE/SICE International Symposium on System Integration, SII 2014
Country/TerritoryJapan
CityTokyo
Period14-12-1314-12-15

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Computer Networks and Communications
  • Information Systems

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