Frequency and noise performances of photoelectrochemically etched and oxidized gate-recessed AlGaN/GaN MOS-HEMTs

Ya Lan Chiou, Chi Sen Lee, Ching Ting Lee

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Frequency and noise performances of photoelectrochemically etched and oxidized gate-recessed AlGaN/GaN MOS-HEMTs'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds