In this paper, we propose a scheme to measure the difference of the surface of the solar cell during manufacturing and packaging. The measurement in the full-field of the solar cell based on the Imaging Ellipsometry has been developed in this study. By using a complex programmable logic device (CPLD) and a charge-coupled device (CCD), integrating buckets with multiple frames are achieved. The sequentially measuring scheme and the algorithm are designed to achieve full-field range measurement. Also, we can figure out the condition of the surface of the solar cell by using the 2-D distributions of (Ψ, Δ). Based on the optical model, we can obtain the defect of the solar cell more precisely. Hence, the proposing system has the ability to tell the difference form the surface of the solar cell. In addition, the intensity noises induced by environmental disturbance can be reduced by the elimination of the DC component of the output light intensity in the algorithm.