Full-field measuring system for the surface of solar cell

Shiou An Tsai, Yu-Lung Lo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we propose a scheme to measure the difference of the surface of the solar cell during manufacturing and packaging. The measurement in the full-field of the solar cell based on the Imaging Ellipsometry has been developed in this study. By using a complex programmable logic device (CPLD) and a charge-coupled device (CCD), integrating buckets with multiple frames are achieved. The sequentially measuring scheme and the algorithm are designed to achieve full-field range measurement. Also, we can figure out the condition of the surface of the solar cell by using the 2-D distributions of (Ψ, Δ). Based on the optical model, we can obtain the defect of the solar cell more precisely. Hence, the proposing system has the ability to tell the difference form the surface of the solar cell. In addition, the intensity noises induced by environmental disturbance can be reduced by the elimination of the DC component of the output light intensity in the algorithm.

Original languageEnglish
Title of host publicationSociety for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010
Pages421-428
Number of pages8
Publication statusPublished - 2010 Nov 9
EventSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010 - Indianapolis, IN, United States
Duration: 2010 Jun 72010 Jun 10

Publication series

NameSociety for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010
Volume1

Other

OtherSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010
CountryUnited States
CityIndianapolis, IN
Period10-06-0710-06-10

Fingerprint

Solar cells
Logic devices
Ellipsometry
Charge coupled devices
Packaging
Imaging techniques
Defects

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials

Cite this

Tsai, S. A., & Lo, Y-L. (2010). Full-field measuring system for the surface of solar cell. In Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010 (pp. 421-428). (Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010; Vol. 1).
Tsai, Shiou An ; Lo, Yu-Lung. / Full-field measuring system for the surface of solar cell. Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010. 2010. pp. 421-428 (Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010).
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Tsai, SA & Lo, Y-L 2010, Full-field measuring system for the surface of solar cell. in Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010. Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010, vol. 1, pp. 421-428, SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010, Indianapolis, IN, United States, 10-06-07.

Full-field measuring system for the surface of solar cell. / Tsai, Shiou An; Lo, Yu-Lung.

Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010. 2010. p. 421-428 (Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010; Vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Tsai SA, Lo Y-L. Full-field measuring system for the surface of solar cell. In Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010. 2010. p. 421-428. (Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010).