Functional test pattern generation for CMOS operational amplifier

Soon-Jyh Chang, Chung Len Lee, Jwu E. Chen

Research output: Contribution to conferencePaperpeer-review

3 Citations (Scopus)

Abstract

In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.

Original languageEnglish
Pages267-272
Number of pages6
Publication statusPublished - 1997 Jan 1
EventProceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA
Duration: 1997 Apr 271997 May 1

Other

OtherProceedings of the 1997 15th VLSI Test Symposium
CityMonterey, CA, USA
Period97-04-2797-05-01

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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