Functional Testing of Content-Addressable Memories

K.-J. Lin, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE International Workshop on Memory Technology, Design and Testing (MTDT)
Place of PublicationSan Jose
Pages70-75
Publication statusPublished - 1998 Aug

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