Abstract
We report the growth and fabrication of GaN-based light-emitting diodes (LEDs) with a high-temperature (HT) AlN nucleation on patterned sapphire substrate. It was found that the undercut sidewalls were only formed for the HT-AlN LED through defect selective etching. At 1-A current injection, the output power of the LED with HT-AlN nucleation was 12% higher than that of an LED with a conventional low temperature GaN nucleation layer.
Original language | English |
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Article number | 6363522 |
Pages (from-to) | 88-90 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 25 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2013 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering