Abstract
A GaN-based Schottky barrier diode (SBD) with a 5-pair AlGaN-GaN intermediate layer for ultraviolet (UV) photodetector (PD) was fabricated and investigated. It was found that we could achieve a smaller dark leakage current and noise level by using the 5-pair AlGaN-GaN intermediate layer. For our device biased at -5V, the responsivity at 360nm was found to be 0.26A/W and the UV-to-visible rejection ratio was estimated to be 1.83Ã - 10 4. At the same bias, it was found that minimum noise equivalent power and normalized detectivity of our device were 1.00Ã - 10 -9W and 1.45Ã - 10 9cmHz 0.5W -1, respectively. This indicates a simple and effective way to fabricate high-performance PDs for UV detection.
| Original language | English |
|---|---|
| Pages (from-to) | 579-584 |
| Number of pages | 6 |
| Journal | Physica Status Solidi (A) Applications and Materials Science |
| Volume | 209 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2012 Mar |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry
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