Abstract
The growth of high quality GaN/AlGaN two-dimensional electron gas on MOCVD GaN template substrates by ammonia-MBE is reported. The homoepitaxial growth required a significantly lower growth temperature than that needed for growth on SiC or sapphire substrates, and yielded significantly improved surface smoothness, and consequently improved electrical, characteristics of the two-dimensional electron gas. A low temperature Hall mobility of 14300 cm2/V s and quantum moblity of 2000 cm2/V s were obtained, representing the highest values observed in the GaN/AlGaN structures grown by the ammonia-MBE technique. A correlation between the surface roughness and increased Hall mobility to quantum mobility ratio was observed, suggesting that the surface roughness could be a source of small-angle scattering in these structures.
Original language | English |
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Pages (from-to) | 822-825 |
Number of pages | 4 |
Journal | Physica Status Solidi (B) Basic Research |
Volume | 234 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2002 Dec |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics