Gate and Drain Currents in Off-State Buried-Type p-Channel LDD MOSFET's

Ming Jer Chen, Kum Chang Chao, Tzuen Hsi Huang, Jyh Min Tsaur

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Gate and Drain Currents in Off-State Buried-Type p-Channel LDD MOSFET's'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds