Gate current dependent hot-carrier-induced degradation in LDMOS transistors

  • J. F. Chen
  • , K. S. Tian
  • , S. Y. Chen
  • , J. R. Lee
  • , K. M. Wu
  • , T. Y. Huang
  • , C. M. Liu

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

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Material Science

Engineering