Generating Single-and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run

Yi Cheng Kung, Kuen Jong Lee, Sudhakar M. Reddy

Research output: Contribution to journalArticlepeer-review


A novel test pattern generation method for multiple dc and ac faults is presented. The fault models considered include line stuck-at, bridging, transition, and transistor stuck-open faults. All faults are transformed into stuck-at faults with some constraints in the proposed two-timeframe circuit model such that all considered faults can be represented utilizing the user-defined fault model supported currently by most commercial ATPG tools. This makes it possible to generate a compact set of patterns for both dc and ac faults in one ATPG run without needing to modify the ATPG tool. Both launch-on-capture and launch-on-shift test methods are supported. The experimental results on ISCAS'89 and ITC'99 benchmark circuits show the effectiveness of the proposed method (PM) compared to earlier PMs.

Original languageEnglish
Article number8732359
Pages (from-to)1340-1345
Number of pages6
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number6
Publication statusPublished - 2020 Jun

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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