Gradually-on structure for scan design

P. C. Chen, J. F. Wang, B. D. Liu

Research output: Contribution to journalArticlepeer-review

Abstract

A new structure named the gradually-on (GO) structure for the full/partial scan design of sequential circuits is proposed. Because this structure allows the scan cells to be turned on gradually, the total test application time can be dramatically reduced.

Original languageEnglish
Pages (from-to)868-870
Number of pages3
JournalElectronics Letters
Volume28
Issue number9
DOIs
Publication statusPublished - 1992 Apr

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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