Graph-based power-constrained test scheduling for SOC

Cheng-Wen Wu, C.-P. Su

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIEEE Int. Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Place of PublicationBrno, Czech Republic
Publication statusPublished - 2002 Apr

Cite this