Graph-based power-constrained test scheduling for SOC

Cheng-Wen Wu, C.-P. Su

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	IEEE Int. Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Place of Publication	Brno, Czech Republic
Publication status	Published - 2002 Apr

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