Gray-level-based corner detection by using wavelet

Jiann Shu Lee, Yung-Nien Sun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Corners are very attractive features for many applications in computer vision. In this paper, a novel gray-level corner detection algorithm based on the wavelet transform is presented. First, we derived several properties of the corner and the edge embedded in the wavelet domain. Next, we apply these similar properties between the corner and the edge to extract the edge image. And then we employed these different properties between the corner and the edge to locate corners. Experiments have shown that our algorithm can detect corners accurately and effectively.

Original languageEnglish
Title of host publicationProc 1993 IEEE Reg 10 Conf Comput Commun Control Power Eng (TENCON '93)
Editors Anon
PublisherPubl by IEEE
Pages970-973
Number of pages4
ISBN (Print)0780312333
Publication statusPublished - 1993 Dec 1
EventProceedings of the 1993 IEEE Region 10 Conference on Computer, Communication, Control aand Power Engineering. Part 3 (of 5) - Beijing, China
Duration: 1993 Oct 191993 Oct 21

Publication series

NameProc 1993 IEEE Reg 10 Conf Comput Commun Control Power Eng (TENCON '93)

Other

OtherProceedings of the 1993 IEEE Region 10 Conference on Computer, Communication, Control aand Power Engineering. Part 3 (of 5)
CityBeijing, China
Period93-10-1993-10-21

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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