Guest editorial

Kuen-Jong Lee, Chau Chin Su

Research output: Contribution to journalEditorial

Original languageEnglish
Pages (from-to)15-16
Number of pages2
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume18
Issue number1
DOIs
Publication statusPublished - 2002 Feb 1

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Digital integrated circuits
Sequential circuits
Combinatorial circuits
Built-in self test
Shift registers
VLSI circuits
Crosstalk
Iterative methods
Computer simulation

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Lee, Kuen-Jong ; Su, Chau Chin. / Guest editorial. In: Journal of Electronic Testing: Theory and Applications (JETTA). 2002 ; Vol. 18, No. 1. pp. 15-16.
@article{d16bac3eeacb471aab771741b4a74d19,
title = "Guest editorial",
author = "Kuen-Jong Lee and Su, {Chau Chin}",
year = "2002",
month = "2",
day = "1",
doi = "10.1023/A:1013719704988",
language = "English",
volume = "18",
pages = "15--16",
journal = "Journal of Electronic Testing: Theory and Applications (JETTA)",
issn = "0923-8174",
publisher = "Springer Netherlands",
number = "1",

}

Guest editorial. / Lee, Kuen-Jong; Su, Chau Chin.

In: Journal of Electronic Testing: Theory and Applications (JETTA), Vol. 18, No. 1, 01.02.2002, p. 15-16.

Research output: Contribution to journalEditorial

TY - JOUR

T1 - Guest editorial

AU - Lee, Kuen-Jong

AU - Su, Chau Chin

PY - 2002/2/1

Y1 - 2002/2/1

UR - http://www.scopus.com/inward/record.url?scp=0036471238&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036471238&partnerID=8YFLogxK

U2 - 10.1023/A:1013719704988

DO - 10.1023/A:1013719704988

M3 - Editorial

AN - SCOPUS:0036471238

VL - 18

SP - 15

EP - 16

JO - Journal of Electronic Testing: Theory and Applications (JETTA)

JF - Journal of Electronic Testing: Theory and Applications (JETTA)

SN - 0923-8174

IS - 1

ER -