Hard X-ray photoemission spectroscopy for intrinsic electronic structure of strongly correlated electron systems

K. Horiba, M. Taguchi, A. Chainani, Y. Takata, N. Kamakura, S. Shin, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, E. Ikenaga, M. Awaji, A. Takeuchi, K. Kobayashi

Research output: Contribution to journalArticlepeer-review

Abstract

In order to clarify the intrinsic bulk electronic structure of strongly-correlated electron systems, we have realized hard X-ray photoemission spectroscopy with high energy-resolution at BL29XUL in SPring-8. The total energy resolution of 75 meV was achieved at the excitation energy of 5.95 keV. Large probing depth of about 100 Å enables us to probe intrinsic bulk electronic structure free from surface condition. The importance and capability of this technique are demonstrated by the drastic difference in the Cu 2p core-level spectra of Nd1.85 Ce0.15 CuO4 crystals obtained using soft and hard X-rays.

Original languageEnglish
Pages (from-to)1152-1153
Number of pages2
JournalPhysica B: Condensed Matter
Volume378-380
Issue numberSPEC. ISS.
DOIs
Publication statusPublished - 2006 May 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Hard X-ray photoemission spectroscopy for intrinsic electronic structure of strongly correlated electron systems'. Together they form a unique fingerprint.

Cite this