Hierarchical Testing Using the IEEE Std 1149.5 Module Test and Maintenance Slave Interface Module

J.-H. Hong, C.-H. Tsai, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
Original languageEnglish
Title of host publication5th IEEE Asian Test Symposium (ATS)
Place of PublicationHsinchu
Pages50-55
Publication statusPublished - 1996 Nov

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