High-density logic techniques with reduced-stack double-gate MOSFETs

Meng-Hsueh Chiang, Keunwoo Kim, Ching Te Chuang, Christophe Tretz

Research output: Contribution to journalConference article

Original languageEnglish
Article number1563544
Pages (from-to)85-86
Number of pages2
JournalProceedings - IEEE International SOI Conference
Volume2005
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE International SOI Conference - Honolulu, HI, United States
Duration: 2005 Oct 32005 Oct 6

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Chiang, Meng-Hsueh ; Kim, Keunwoo ; Chuang, Ching Te ; Tretz, Christophe. / High-density logic techniques with reduced-stack double-gate MOSFETs. In: Proceedings - IEEE International SOI Conference. 2005 ; Vol. 2005. pp. 85-86.
@article{9dff373c90fa432abf8eddd40a17910b,
title = "High-density logic techniques with reduced-stack double-gate MOSFETs",
author = "Meng-Hsueh Chiang and Keunwoo Kim and Chuang, {Ching Te} and Christophe Tretz",
year = "2005",
month = "12",
day = "1",
doi = "10.1109/SOI.2005.1563544",
language = "English",
volume = "2005",
pages = "85--86",
journal = "IEEE International SOI Conference",
issn = "1078-621X",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

High-density logic techniques with reduced-stack double-gate MOSFETs. / Chiang, Meng-Hsueh; Kim, Keunwoo; Chuang, Ching Te; Tretz, Christophe.

In: Proceedings - IEEE International SOI Conference, Vol. 2005, 1563544, 01.12.2005, p. 85-86.

Research output: Contribution to journalConference article

TY - JOUR

T1 - High-density logic techniques with reduced-stack double-gate MOSFETs

AU - Chiang, Meng-Hsueh

AU - Kim, Keunwoo

AU - Chuang, Ching Te

AU - Tretz, Christophe

PY - 2005/12/1

Y1 - 2005/12/1

UR - http://www.scopus.com/inward/record.url?scp=33744719368&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33744719368&partnerID=8YFLogxK

U2 - 10.1109/SOI.2005.1563544

DO - 10.1109/SOI.2005.1563544

M3 - Conference article

AN - SCOPUS:33744719368

VL - 2005

SP - 85

EP - 86

JO - IEEE International SOI Conference

JF - IEEE International SOI Conference

SN - 1078-621X

M1 - 1563544

ER -