TY - GEN
T1 - High efficiency polymer light-emitting diodes using ternary electron injection layers
AU - Wen, Ten-Chin
AU - Tsai, Kai Wei
AU - Jan, Jiun Yun
AU - Guo, Tzung-Fang
PY - 2016/1/1
Y1 - 2016/1/1
N2 - The high efficiency of polymer light-emitting diodes (PLED) with ternary electron injection layers (EILs) including tetraoctylammonium bromide (TOAB), poly (vinylpyrrolidone) (PVP) and polyethylenimine (PEIE) to comprise PEIE-PVP-TOAB (E-P-T) EIL that has been achieved and well-studied via mixture design. In the unary system, TOAB can construct interfacial dipole via self-assembly crystallization atop various conjugated polymer surfaces to elevate the vacuum level of cathode. When employing three EILs as ternary system, the electrical property of PLED was further improved. The optimum luminescence efficiency respectively are 13.4 cd/A and 13.5 cd/A for T-P-D and E-P-T based PLED. In the ternary system (E-P-T), PEIE, PVP, and TOAB respectively provides electron injection, hole blocking, and polymer intersecting in the ternary based devices. The intersecting between PEIE and PVP by TOAB was evidenced by roughness change from AFM images.
AB - The high efficiency of polymer light-emitting diodes (PLED) with ternary electron injection layers (EILs) including tetraoctylammonium bromide (TOAB), poly (vinylpyrrolidone) (PVP) and polyethylenimine (PEIE) to comprise PEIE-PVP-TOAB (E-P-T) EIL that has been achieved and well-studied via mixture design. In the unary system, TOAB can construct interfacial dipole via self-assembly crystallization atop various conjugated polymer surfaces to elevate the vacuum level of cathode. When employing three EILs as ternary system, the electrical property of PLED was further improved. The optimum luminescence efficiency respectively are 13.4 cd/A and 13.5 cd/A for T-P-D and E-P-T based PLED. In the ternary system (E-P-T), PEIE, PVP, and TOAB respectively provides electron injection, hole blocking, and polymer intersecting in the ternary based devices. The intersecting between PEIE and PVP by TOAB was evidenced by roughness change from AFM images.
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U2 - 10.1117/12.2209484
DO - 10.1117/12.2209484
M3 - Conference contribution
AN - SCOPUS:84974851888
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Organic Photonic Materials and Devices XVIII
A2 - Kajzar, Francois
A2 - Tabor, Christopher E.
A2 - Kaino, Toshikuni
A2 - Koike, Yasuhiro
PB - SPIE
T2 - Organic Photonic Materials and Devices XVIII
Y2 - 15 February 2016 through 17 February 2016
ER -