TY - JOUR
T1 - High-Performance Electron Field Emitters and Microplasma Cathodes Based on Conductive Hybrid Granular Structured Diamond Materials
AU - Saravanan, Adhimoorthy
AU - Huang, Bohr Ran
AU - Manoharan, Divinah
AU - Lin, I. Nan
N1 - Publisher Copyright:
© 2017 American Chemical Society.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/2/8
Y1 - 2017/2/8
N2 - High-performance diamond electron field emitters (EFEs) with extremely low turn-on field (E0 = 1.72 V/μm) and high current density (1.70 mA/cm2 at an applied field of 3.86 V/μm) were successfully synthesized by using a modified two-step microwave plasma chemical deposition process. Such emitters possess EFE properties comparable with most of carbon- or semiconductor-based EFE materials, but with markedly better lifetime stability. The superb EFE behavior of these materials was achieved owing to the reduction in the diamond-to-Si interfacial resistance and the increase in the conductivity of the bulk diamond films (HBD-400 V) via the applications of high bias voltage during the preparation of the ultrananocrystalline diamond (UNCD) primary layer and the subsequent plasma post-treatment (PPT) process, respectively. The superior EFE properties along with enhanced robustness of HBD-400 V films compared with the existing diamond-based EFE materials rendered these materials of greater potential for applications in high brightness display and multifunctional microplasma.
AB - High-performance diamond electron field emitters (EFEs) with extremely low turn-on field (E0 = 1.72 V/μm) and high current density (1.70 mA/cm2 at an applied field of 3.86 V/μm) were successfully synthesized by using a modified two-step microwave plasma chemical deposition process. Such emitters possess EFE properties comparable with most of carbon- or semiconductor-based EFE materials, but with markedly better lifetime stability. The superb EFE behavior of these materials was achieved owing to the reduction in the diamond-to-Si interfacial resistance and the increase in the conductivity of the bulk diamond films (HBD-400 V) via the applications of high bias voltage during the preparation of the ultrananocrystalline diamond (UNCD) primary layer and the subsequent plasma post-treatment (PPT) process, respectively. The superior EFE properties along with enhanced robustness of HBD-400 V films compared with the existing diamond-based EFE materials rendered these materials of greater potential for applications in high brightness display and multifunctional microplasma.
UR - http://www.scopus.com/inward/record.url?scp=85012031573&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85012031573&partnerID=8YFLogxK
U2 - 10.1021/acsami.6b12375
DO - 10.1021/acsami.6b12375
M3 - Article
C2 - 28084726
AN - SCOPUS:85012031573
SN - 1944-8244
VL - 9
SP - 4916
EP - 4925
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 5
ER -