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High-Rate Anisotropic Etching of Silicon by Remote Microwave Plasma in Sulfur-Hexafluoride
Y. Tzeng
, T. H. Lin
, J. Waddell
Institute of Microelectronics
Research output
:
Contribution to journal
›
Article
›
peer-review
5
Citations (Scopus)
Overview
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Dive into the research topics of 'High-Rate Anisotropic Etching of Silicon by Remote Microwave Plasma in Sulfur-Hexafluoride'. Together they form a unique fingerprint.
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Engineering
Anisotropic
100%
Microwave Plasma
100%
Substrate Temperature
100%
Etch Rate
66%
Thin Films
33%
Silicon Wafer
33%
Ion Implantation
33%
Light Emission
33%
Side Wall
33%
Photoresist
33%
Crystalline Silicon
33%
Keyphrases
Sulfur Hexafluoride
100%
Silicon Etching
66%
SF6 Plasma
33%
CuxS
33%
Etch Profile
33%
Atomic Fluorine
33%
Photoresist Mask
33%
Vertical Etching
33%
Catalyst Temperature
33%
Material Science
Silicon
100%
Anisotropic Etching
100%
Energy-Dispersive X-Ray Spectroscopy
33%
Thin Films
33%
Ion Bombardment
33%
Emission Spectroscopy
33%
Silicon Wafer
33%