@inproceedings{82b47974ac7641bfa3bba0fcc3c43f23,
title = "Highly reliable gate driver circuit with modulated gate bias for threshold voltage amelioration",
abstract = "This work introduces an a-Si:H gate driver combining an AC-driving method with modulated VGS of pull-down TFTs to further improve the V TH shift for long-term operation. The experimental results indicate the VTH shift of a TFT with the proposed scheme is reduced by 58.33% compared to that of DC-bias stress.",
author = "Cheng, {Mao Hsun} and Tu, {Chun Da} and Lin, {Chih Lung}",
year = "2012",
language = "English",
isbn = "9781627486521",
series = "Proceedings of the International Display Workshops",
pages = "351--353",
booktitle = "Society for Information Display - 19th International Display Workshops 2012, IDW/AD 2012",
note = "19th International Display Workshops in Conjunction with Asia Display 2012, IDW/AD 2012 ; Conference date: 04-12-2012 Through 07-12-2012",
}
