Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F2/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM

Tsai Kan Chien, Lih Yih Chiou, Chi Shian Chang, Jing Yu Huang, Chung Han Wu, Heng Yuan Lee, Shyh Shyuan Sheu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F2/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM'. Together they form a unique fingerprint.

Engineering & Materials Science