| Original language | English |
|---|---|
| Title of host publication | IEEE Int. Workshop on Memory Technology, Design and Testing (MTDT) |
| Place of Publication | Taipei |
| Publication status | Published - 2007 Dec |
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How Far can We Go in Wireless Testing of Memory Chips and Wafers?
- Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution