Identification of Edge Recombination from CIGS Solar Cells

Shih Hung Lin, Yan Chih Lu, Cheng Chi Tai, Cheng Tzu-Huan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CIGS solar cells has high opportunity to achieve high efficiency. The analysis of efficiency loss plays an important role for efficiency boost. The recombination loss often occurs at junction, bulk, surface, and edge position and leads to solar cell efficiency loss. Electroluminescence from defect-related optical transition is applied for defect analysis in CIGS solar cells. The micro-QE measurement is used for edge recombination analysis and reveals the recombination behavior of CIGS solar cells. EQE response at short wavelength region represents the quality of shallow region along light incident direction and used in the edge recombination study as well as EL intensity distribution.

Original languageEnglish
Title of host publicationAM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices
Subtitle of host publicationTFT Technologies and FPD Materials, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784990875374
DOIs
Publication statusPublished - 2019 Jul
Event26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2019 - Kyoto, Japan
Duration: 2019 Jul 22019 Jul 5

Publication series

NameAM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings

Conference

Conference26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2019
CountryJapan
CityKyoto
Period19-07-0219-07-05

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All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Media Technology
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cite this

Lin, S. H., Lu, Y. C., Tai, C. C., & Tzu-Huan, C. (2019). Identification of Edge Recombination from CIGS Solar Cells. In AM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings [8830632] (AM-FPD 2019 - 26th International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/AM-FPD.2019.8830632