Imaging and characterization of piezoelectric potential in a single bent ZnO microwire

Chiang Lun Wang, Shu Ju Tsai, Jhih Wei Chen, Hong Wei Shiu, Lo Yueh Chang, Kai Hsiang Lin, Hsu Cheng Hsu, Yi Chun Chen, Chia Hao Chen, Chung Lin Wu

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.

Original languageEnglish
Article number123115
JournalApplied Physics Letters
Issue number12
Publication statusPublished - 2014 Sept 22

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Imaging and characterization of piezoelectric potential in a single bent ZnO microwire'. Together they form a unique fingerprint.

Cite this