Abstract
We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.
| Original language | English |
|---|---|
| Article number | 123115 |
| Journal | Applied Physics Letters |
| Volume | 105 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 2014 Sep 22 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
Cite this
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Imaging and characterization of piezoelectric potential in a single bent ZnO microwire. / Wang, Chiang Lun; Tsai, Shu Ju; Chen, Jhih Wei; Shiu, Hong Wei; Chang, Lo Yueh; Lin, Kai Hsiang; Hsu, Hsu Cheng; Chen, Yi Chun; Chen, Chia Hao; Wu, Chung Lin.
In: Applied Physics Letters, Vol. 105, No. 12, 123115, 22.09.2014.Research output: Contribution to journal › Article
TY - JOUR
T1 - Imaging and characterization of piezoelectric potential in a single bent ZnO microwire
AU - Wang, Chiang Lun
AU - Tsai, Shu Ju
AU - Chen, Jhih Wei
AU - Shiu, Hong Wei
AU - Chang, Lo Yueh
AU - Lin, Kai Hsiang
AU - Hsu, Hsu Cheng
AU - Chen, Yi Chun
AU - Chen, Chia Hao
AU - Wu, Chung Lin
PY - 2014/9/22
Y1 - 2014/9/22
N2 - We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.
AB - We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.
UR - http://www.scopus.com/inward/record.url?scp=84907546311&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84907546311&partnerID=8YFLogxK
U2 - 10.1063/1.4896546
DO - 10.1063/1.4896546
M3 - Article
AN - SCOPUS:84907546311
VL - 105
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 12
M1 - 123115
ER -