Skip to main navigation Skip to search Skip to main content

Impact of gate tunneling on the nature of the charge dump current in 100 nm PDSOI technology

Research output: Contribution to conference › Paper › peer-review

1   Link opens in a new tab Citation (Scopus)

Fingerprint

Dive into the research topics of 'Impact of gate tunneling on the nature of the charge dump current in 100 nm PDSOI technology'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science

Keyphrases