Impact of resistance drift on multilevel PCM design

Yi Hsuan Chiu, Yi Bo Liao, Meng-Hsueh Chiang, Chia Long Lin, Wei-Chou Hsu, Pei Chia Chiang, Yen Ya Hsu, Wen Hsing Liu, Shyh Shyuan Sheu, Keng Li Su, Ming Jer Kao, Ming Jinn Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Design issues and insights of multilevel phase change memory are presented. Based on a proposed compact model calibrated to measured data, we assess the impact of resistance drift on multilevel cell design. It is found that special care has to be taken to develop a viable multilevel design as the design window could be degraded and worsened at high temperature.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages20-23
Number of pages4
DOIs
Publication statusPublished - 2010 Aug 20
Event2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
Duration: 2010 Jun 22010 Jun 4

Publication series

Name2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Other

Other2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
CountryFrance
CityGrenoble
Period10-06-0210-06-04

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Impact of resistance drift on multilevel PCM design'. Together they form a unique fingerprint.

  • Cite this

    Chiu, Y. H., Liao, Y. B., Chiang, M-H., Lin, C. L., Hsu, W-C., Chiang, P. C., Hsu, Y. Y., Liu, W. H., Sheu, S. S., Su, K. L., Kao, M. J., & Tsai, M. J. (2010). Impact of resistance drift on multilevel PCM design. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (pp. 20-23). [5510298] (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510298