Impact of SMT-induced edge dislocation positions to NFET performance

Tzer Min Shen, Shui Jinn Wang, Zhi Ren Xiao, Chung Cheng Wu, Jeff Wu, Carlos H. Diaz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Impact of SMT-induced edge dislocation positions to NFET performance'. Together they form a unique fingerprint.

Engineering & Materials Science