Impact of stress-memorization technique induced-tensile strain on low frequency noise in n-channel metal-oxide-semiconductor transistors

Cheng Wen Kuo, San Lein Wu, Shoou Jinn Chang, Yao Tsung Huang, Yao Chin Cheng, Osbert Cheng

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

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Physics & Astronomy