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Impact of stress-memorization technique induced-tensile strain on low frequency noise in n-channel metal-oxide-semiconductor transistors

  • Cheng Wen Kuo
  • , San Lein Wu
  • , Shoou Jinn Chang
  • , Yao Tsung Huang
  • , Yao Chin Cheng
  • , Osbert Cheng

Research output: Contribution to journal › Article › peer-review

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