Impact of uniaxial strain on random telegraph noise in high-k/metal gate pMOSFETs

  • Po Chin Huang
  • , Jone F. Chen
  • , Shih Chang Tsai
  • , San Lein Wu
  • , Kai Shiang Tsai
  • , Tsung Hsien Kao
  • , Yean Kuen Fang
  • , Chien Ming Lai
  • , Chia Wei Hsu
  • , Yi Wen Chen
  • , Osbert Cheng

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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Engineering