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Impact of uniaxial strain on random telegraph noise in high-k/metal gate pMOSFETs
Po Chin Huang, Jone F. Chen, Shih Chang Tsai, San Lein Wu, Kai Shiang Tsai, Tsung Hsien Kao, Yean Kuen Fang, Chien Ming Lai, Chia Wei Hsu, Yi Wen Chen, Osbert Cheng
Research output: Contribution to journal › Article › peer-review
2
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(Scopus)