Abstract
A novel GaAs/In0.25Ga0.75As/GaAs heterostructure field effect transistor with δ-doping of the GaAs on both sides of the InGaAs channel has been grown by low-pressure metalorganic chemical vapor deposition (LP-MOCVD). Very high two dimensional electron gas (2DEG) concentration of 5.1 and 3.4 × 1012 cm-2 at 300 and 77 K respectively, along with enhanced electron mobilities of 4500 and 14100 cm2/v·s at 300 and 77 K respectively, were achieved. A maximum extrinsic transconductance of 140 mS/mm and a high saturation current density of 460 mA/mm at 300 K for a gate length of 2 μm, were obtained. A broad transconductance region extending from reverse to forward gate bias was observed due to the double δ-doped GaAs grown symmetrically on both sides of the channel.
Original language | English |
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Pages (from-to) | 1235-1237 |
Number of pages | 3 |
Journal | Solid State Electronics |
Volume | 36 |
Issue number | 9 |
DOIs | |
Publication status | Published - 1993 Jan 1 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry