Improvement of luminance degradation via the top emission structure for AMOLED displays

Chih-Lung Lin, Yu Zhan Tsai, Kuan Wen Chou, Chun Da Tu

Research output: Contribution to conferencePaper

Abstract

A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

Original languageEnglish
Publication statusPublished - 2009 Dec 1
Event2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009 - Taipei, Taiwan
Duration: 2009 Apr 272009 Apr 30

Other

Other2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009
CountryTaiwan
CityTaipei
Period09-04-2709-04-30

Fingerprint

Luminance
Pixels
Display devices
Degradation
Networks (circuits)
Organic light emitting diodes (OLED)
Threshold voltage
Integrated circuits
Computer simulation

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Human-Computer Interaction

Cite this

Lin, C-L., Tsai, Y. Z., Chou, K. W., & Tu, C. D. (2009). Improvement of luminance degradation via the top emission structure for AMOLED displays. Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan.
Lin, Chih-Lung ; Tsai, Yu Zhan ; Chou, Kuan Wen ; Tu, Chun Da. / Improvement of luminance degradation via the top emission structure for AMOLED displays. Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan.
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abstract = "A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5{\%}.",
author = "Chih-Lung Lin and Tsai, {Yu Zhan} and Chou, {Kuan Wen} and Tu, {Chun Da}",
year = "2009",
month = "12",
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note = "2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009 ; Conference date: 27-04-2009 Through 30-04-2009",

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Lin, C-L, Tsai, YZ, Chou, KW & Tu, CD 2009, 'Improvement of luminance degradation via the top emission structure for AMOLED displays' Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan, 09-04-27 - 09-04-30, .

Improvement of luminance degradation via the top emission structure for AMOLED displays. / Lin, Chih-Lung; Tsai, Yu Zhan; Chou, Kuan Wen; Tu, Chun Da.

2009. Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan.

Research output: Contribution to conferencePaper

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AU - Lin, Chih-Lung

AU - Tsai, Yu Zhan

AU - Chou, Kuan Wen

AU - Tu, Chun Da

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Y1 - 2009/12/1

N2 - A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

AB - A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

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M3 - Paper

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Lin C-L, Tsai YZ, Chou KW, Tu CD. Improvement of luminance degradation via the top emission structure for AMOLED displays. 2009. Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan.