Improvement of luminance degradation via the top emission structure for AMOLED displays

Chih-Lung Lin, Yu Zhan Tsai, Kuan Wen Chou, Chun Da Tu

Research output: Contribution to conferencePaper

Abstract

A novel pixel circuit using top emission structure for AMOLED is presented and verified by Automatic Integrated Circuit Modeling Spice simulation. The proposed circuit has a high immunity against the threshold voltage variations of TFT and degradation of the OLED device. Simulation results show that the pixel current error rate is lower than 5%.

Original languageEnglish
Publication statusPublished - 2009 Dec 1
Event2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009 - Taipei, Taiwan
Duration: 2009 Apr 272009 Apr 30

Other

Other2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009
CountryTaiwan
CityTaipei
Period09-04-2709-04-30

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Human-Computer Interaction

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    Lin, C-L., Tsai, Y. Z., Chou, K. W., & Tu, C. D. (2009). Improvement of luminance degradation via the top emission structure for AMOLED displays. Paper presented at 2009 International Display Manufacturing Conference, 3D Systems and Applications, and Asia Display, IDMC/3DSA/Asia Display 2009, Taipei, Taiwan.