Improving testing and diagnosis efficiency for regular memory arrays

Tsung Yu Wu, Po Yuan Chen, Cheng Wen Wu, Ding Ming Kwai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Built-in self-test (BIST) is one of the most widely used design-for-testability (DFT) techniques, particularly for embedded random access memory (RAM). To ease the test and diagnosis flow, we have previously developed a synthesis compiler, called BRAINS which stands for BIST for RAM in Seconds. It possesses many nice features, such as accessibility, scalability, programmability, and flexibility, thereby improving the testability, yield, and reliability. However, for regular arrays, the conventional flow attaches a BIST circuit to each memory element, and scans in test patterns or performs sequential diagnosis, so is inefficient in terms of test time. In this work, we extend the BRAINS functions by taking advantage of the regular structure. With these extensions, the test and diagnosis flow becomes very simple. In the experiments on a 32-core array, the overall test time can be reduced by 6 to 23 times with only minor area overhead varying from 10% to 17%, as compared with the original BRAINS design.

Original languageEnglish
Title of host publicationProceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
Pages100-103
Number of pages4
DOIs
Publication statusPublished - 2010 Nov 8
Event2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010 - Hsin Chu, Taiwan
Duration: 2010 Apr 262010 Apr 29

Publication series

NameProceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010

Other

Other2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010
CountryTaiwan
CityHsin Chu
Period10-04-2610-04-29

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Improving testing and diagnosis efficiency for regular memory arrays'. Together they form a unique fingerprint.

Cite this