Improving the Brightness and Reliability of InGaN/GaN Near Ultraviolet Light-Emitting Diodes by Controlling the Morphology of the GaN Buffer Layer

S. C. Tsai, H. C. Fang, C. H. Lu, Y. L. Lai, C. P. Liu

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

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