In-plane thermoelectric properties of Si/Ge superlattice

W. L. Liu, T. Borca-Tasciuc, J. L. Liu, K. Taka, K. L. Wang, M. S. Dresselhaus, G. Chen

Research output: Contribution to conferencePaperpeer-review

11 Citations (Scopus)

Abstract

In this paper we report experimental investigation of the in-plane thermoelectric properties of Si/Ge superlattices grown on silicon-on-insulator wafers. A two-wire 3ω method was employed to measure the in-plane thermal conductivity of the superlattice sample investigated. The in-plane Seebeck coefficient and electrical conductivity of the same sample are also measured. Experimental data are compared with the results of theoretical models of carrier transport based on carrier pocket engineering and partial diffuse phonon interface scattering.

Original languageEnglish
Pages340-343
Number of pages4
Publication statusPublished - 2001
Event20th International Conference on Thermoelectrics ICT'01 - Beijing, China
Duration: 2001 Jun 82001 Jun 11

Conference

Conference20th International Conference on Thermoelectrics ICT'01
CountryChina
CityBeijing
Period01-06-0801-06-11

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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