In search of a product mix for semiconductor wafer fabrication facilities by a combined simulation/neural network approach

Ta-Ho Yang, C. T. Su, Y. C. Feng

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The product mix decision has a direct impact on the process tools utilization. While the commonly seen methodologies may be effective in solving the product mix decision problems from many manufacturing settings, they are not adequate in solving the problems from wafer fabrication facilities due to both the complex nature of the wafer fabrication process and the high tool inventory costs. This paper proposes a combined simulation/neural network based approach to solve the product mix problem for a given tool utilization/WIP level. Solution quality of the proposed methodology is justified through a real world case study. Empirical results illustrate its efficiency and effectiveness in solving a product mix problem for semiconductor wafer fabrication facilities.

Original languageEnglish
Pages (from-to)142-147
Number of pages6
JournalInternational Journal of Industrial Engineering : Theory Applications and Practice
Volume8
Issue number2
Publication statusPublished - 2001 Jan 1

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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