In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet

Yih Farn Kao, Shi Rong Chen, Jr-Jeng Ruan

Research output: Contribution to journalArticle

Abstract

The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process.

Original languageEnglish
Pages (from-to)1046-1050
Number of pages5
JournalJournal of Alloys and Compounds
Volume740
DOIs
Publication statusPublished - 2018 Apr 5

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Aluminum alloys
Annealing
Yield stress
Isothermal annealing
Activation energy
Engineers
Experiments
Temperature

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this

@article{72f50249f74b449fafa0d4d04bc31952,
title = "In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet",
abstract = "The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process.",
author = "Kao, {Yih Farn} and Chen, {Shi Rong} and Jr-Jeng Ruan",
year = "2018",
month = "4",
day = "5",
doi = "10.1016/j.jallcom.2018.01.028",
language = "English",
volume = "740",
pages = "1046--1050",
journal = "Journal of Alloys and Compounds",
issn = "0925-8388",
publisher = "Elsevier BV",

}

In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet. / Kao, Yih Farn; Chen, Shi Rong; Ruan, Jr-Jeng.

In: Journal of Alloys and Compounds, Vol. 740, 05.04.2018, p. 1046-1050.

Research output: Contribution to journalArticle

TY - JOUR

T1 - In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet

AU - Kao, Yih Farn

AU - Chen, Shi Rong

AU - Ruan, Jr-Jeng

PY - 2018/4/5

Y1 - 2018/4/5

N2 - The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process.

AB - The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process.

UR - http://www.scopus.com/inward/record.url?scp=85040251811&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85040251811&partnerID=8YFLogxK

U2 - 10.1016/j.jallcom.2018.01.028

DO - 10.1016/j.jallcom.2018.01.028

M3 - Article

VL - 740

SP - 1046

EP - 1050

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

SN - 0925-8388

ER -