IN SITU PULSE-BASED DELAY VARIATION MONITOR PREDICTING TIMING ERROR CAUSED BY PROCESS AND ENVIRONMENTAL VARIATION

Lih-Yih Chiou (Inventor)

Research output: Patent

Abstract

An in situ pulse-based delay variation monitor that predicts timing errors caused by process and environmental variations is revealed. The monitor includes a sequential storage device having a mater storage device and a slave storage device, a transition detector that is electrically connected to a node set on an electrical connection pathway from a master storage device to the slave storage device, and a warning signal generator electrically connected to the transition detector.
Translated title of the contribution具有能預測因製程與環境變異所造成時序錯誤的嵌入式脈衝時序電路系統
Original languageEnglish
Patent number9094002
Publication statusPublished - 2013 Dec 4

Fingerprint Dive into the research topics of 'IN SITU PULSE-BASED DELAY VARIATION MONITOR PREDICTING TIMING ERROR CAUSED BY PROCESS AND ENVIRONMENTAL VARIATION'. Together they form a unique fingerprint.

Cite this