IN SITU PULSE-BASED DELAY VARIATION MONITOR PREDICTING TIMING ERROR CAUSED BY PROCESS AND ENVIRONMENTAL VARIATION

Lih-Yih Chiou (Inventor)

Research output: Patent

Abstract

An in situ pulse-based delay variation monitor that predicts timing errors caused by process and environmental variations is revealed. The monitor includes a sequential storage device having a mater storage device and a slave storage device, a transition detector that is electrically connected to a node set on an electrical connection pathway from a master storage device to the slave storage device, and a warning signal generator electrically connected to the transition detector.
Original languageEnglish
Patent number9094002
Publication statusPublished - 2013 Dec 4

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