In Situ Synchrotron X-ray Diffraction Measurement of the Strain Distribution in Si Die for the Embedded Substrates

Physics & Astronomy

• strain distribution 88%
• synchrotrons 65%
• miniaturization 42%
• plane strain 41%
• diffraction 40%
• packaging 39%
• integrated circuits 35%
• flexibility 34%
• x rays 33%
• emerging 33%
• thermal expansion 32%
• modules 31%
• computer programs 27%
• cycles 25%
• temperature 22%
• coefficients 20%
• simulation 14%

Engineering & Materials Science

• Synchrotrons 100%
• X ray diffraction 74%
• Substrates 53%
• Thermal expansion 25%
• Integrated circuits 23%
• X rays 22%
• Packaging 22%
• Temperature 20%
• Computer simulation 13%
• Hot Temperature 12%

Chemical Compounds

• Thermal Expansion Coefficient 29%
• Flexibility 20%
• Simulation 15%