In Situ Synchrotron X-ray Diffraction Measurement of the Strain Distribution in Si Die for the Embedded Substrates

Hsueh Hsien Hsu, Hao Chen, Yao Tsung Ouyang, Tz Cheng Chiu, Tao Chih Chang, Hsin Yi Lee, Chin Shun Ku, Albert T. Wu

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Physics & Astronomy

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Chemical Compounds