TY - JOUR
T1 - In situ X-ray absorption spectroscopic studies of CCl4 mineralization with CuO
AU - Chien, Yi Chi
AU - Wang, H. Paul
N1 - Funding Information:
The financial support of the National Science Council, Taiwan is gratefully acknowledged. We also thank Prof. Y.W. Yang and Dr. J.-F. Lee of the Taiwan Synchrotron Radiation Research Center for their help in the EXAFS experiments.
PY - 2005/6
Y1 - 2005/6
N2 - Mineralization of CCl4 with CuO has been studied by in situ X-ray absorption spectroscopy (XAS) in the present work. The least-square fitted X-ray absorption near-edge structural (XANES) spectra showed that 18.9-20.1% of CuCl2 was yielded in the mineralization of CCl4 with CuO at 513-603 K for 20 min. By in situ extended X-ray absorption fine structural (EXAFS) spectroscopy, the structural perturbation of CuO during mineralization was observed. The perturbation may be due to an insertion of Cl species into the matrix of CuO and formation of CuCl2. Bond distances of CuO (first shell) and Cu(O)Cu (2nd shell) were increased by 0.01-0.04 Å with slight decreases of their coordination numbers (CNs) in the mineralization process. CuCl2 in the CCl4-mineralized product solids possessed CuCl bond distances of 2.10-2.12 Å, which were greater than that of the CuCl2 model compound (2.05 Å). The in situ XAS technique exemplifies a direct observation of perturbation of CuO by Cl species during the mineralization at elevated temperatures.
AB - Mineralization of CCl4 with CuO has been studied by in situ X-ray absorption spectroscopy (XAS) in the present work. The least-square fitted X-ray absorption near-edge structural (XANES) spectra showed that 18.9-20.1% of CuCl2 was yielded in the mineralization of CCl4 with CuO at 513-603 K for 20 min. By in situ extended X-ray absorption fine structural (EXAFS) spectroscopy, the structural perturbation of CuO during mineralization was observed. The perturbation may be due to an insertion of Cl species into the matrix of CuO and formation of CuCl2. Bond distances of CuO (first shell) and Cu(O)Cu (2nd shell) were increased by 0.01-0.04 Å with slight decreases of their coordination numbers (CNs) in the mineralization process. CuCl2 in the CCl4-mineralized product solids possessed CuCl bond distances of 2.10-2.12 Å, which were greater than that of the CuCl2 model compound (2.05 Å). The in situ XAS technique exemplifies a direct observation of perturbation of CuO by Cl species during the mineralization at elevated temperatures.
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U2 - 10.1016/j.elspec.2005.01.282
DO - 10.1016/j.elspec.2005.01.282
M3 - Article
AN - SCOPUS:17444391311
SN - 0368-2048
VL - 144-147
SP - 315
EP - 318
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
ER -