TY - GEN
T1 - In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV
AU - Chuang, Han Sheng
AU - Wereley, Steven T.
PY - 2008
Y1 - 2008
N2 - Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow, CDI scheme showed a 0.32% error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35%. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state now images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.
AB - Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow, CDI scheme showed a 0.32% error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35%. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state now images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.
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U2 - 10.1115/IMECE2007-41171
DO - 10.1115/IMECE2007-41171
M3 - Conference contribution
AN - SCOPUS:44349172909
SN - 079184305X
SN - 9780791843055
T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings
SP - 697
EP - 703
BT - Micro and Nano Systems
PB - American Society of Mechanical Engineers (ASME)
T2 - ASME International Mechanical Engineering Congress and Exposition, IMECE 2007
Y2 - 11 November 2007 through 15 November 2007
ER -