In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV

Han-Sheng Chuang, Steven T. Wereley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow. CDI scheme showed a 0.32% error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35%. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state flow images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.

Original languageEnglish
Title of host publicationMicro and Nano Systems
PublisherAmerican Society of Mechanical Engineers (ASME)
Pages697-703
Number of pages7
ISBN (Electronic)079184305X
DOIs
Publication statusPublished - 2007 Jan 1
EventASME 2007 International Mechanical Engineering Congress and Exposition, IMECE 2007 - Seattle, United States
Duration: 2007 Nov 112007 Nov 15

Publication series

NameASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
Volume11

Other

OtherASME 2007 International Mechanical Engineering Congress and Exposition, IMECE 2007
CountryUnited States
CitySeattle
Period07-11-1107-11-15

Fingerprint

Stress measurement
Shear stress
Pixels
CCD cameras
Microchannels
Measurement errors
Fast Fourier transforms

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering

Cite this

Chuang, H-S., & Wereley, S. T. (2007). In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV. In Micro and Nano Systems (pp. 697-703). (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE); Vol. 11). American Society of Mechanical Engineers (ASME). https://doi.org/10.1115/IMECE200741171
Chuang, Han-Sheng ; Wereley, Steven T. / In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV. Micro and Nano Systems. American Society of Mechanical Engineers (ASME), 2007. pp. 697-703 (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)).
@inproceedings{62a3c3e634ac4215b38bc1b7e3df6fcd,
title = "In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV",
abstract = "Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow. CDI scheme showed a 0.32{\%} error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35{\%}. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state flow images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.",
author = "Han-Sheng Chuang and Wereley, {Steven T.}",
year = "2007",
month = "1",
day = "1",
doi = "10.1115/IMECE200741171",
language = "English",
series = "ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)",
publisher = "American Society of Mechanical Engineers (ASME)",
pages = "697--703",
booktitle = "Micro and Nano Systems",

}

Chuang, H-S & Wereley, ST 2007, In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV. in Micro and Nano Systems. ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), vol. 11, American Society of Mechanical Engineers (ASME), pp. 697-703, ASME 2007 International Mechanical Engineering Congress and Exposition, IMECE 2007, Seattle, United States, 07-11-11. https://doi.org/10.1115/IMECE200741171

In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV. / Chuang, Han-Sheng; Wereley, Steven T.

Micro and Nano Systems. American Society of Mechanical Engineers (ASME), 2007. p. 697-703 (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE); Vol. 11).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV

AU - Chuang, Han-Sheng

AU - Wereley, Steven T.

PY - 2007/1/1

Y1 - 2007/1/1

N2 - Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow. CDI scheme showed a 0.32% error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35%. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state flow images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.

AB - Conventional single pixel evaluation (SPE) significantly improves the spatial resolution of PIV measurements to the physical limit of a CCD camera based on the forward difference interrogation (FDI). This paper further enhances the computational algorithm to second-order accuracy by simply modifying the numerical scheme with the central difference interrogation (CDI). The proposed central difference scheme basically superposes the forward-time and the backward-time correlation domains, thus resulting in reduced bias error as well as rapid background noise elimination. An assessment of the CDI SPE algorithm regarding the measurement errors was achieved via numerous synthetic images subject to a four-roll mill flow. In addition, preliminary wall shear stress (WSS) measurements regarding different algorithms are also evaluated with an analytical turbulent boundary flow. CDI scheme showed a 0.32% error deviated from the analytical solution and improved the same error in FFT-based correlation correlation (FFT-CC) by 32.35%. To demonstrate the performance in practice, in-vitro measurements were implemented in a serpentine microchannel made of polydimethyl siloxane (PDMS) for both CDI SPE and spatial cross-correlation. A series of steady-state flow images at five specified regions of interest were acquired using micro-PIV system. Final comparisons of the WSS regarding the Pearson correlation coefficient, R2, between the numerical schemes and the simulations showed that an overall result was improved by CDI SPE due to the fine resolution and the enhanced accuracy.

UR - http://www.scopus.com/inward/record.url?scp=84928645753&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84928645753&partnerID=8YFLogxK

U2 - 10.1115/IMECE200741171

DO - 10.1115/IMECE200741171

M3 - Conference contribution

T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)

SP - 697

EP - 703

BT - Micro and Nano Systems

PB - American Society of Mechanical Engineers (ASME)

ER -

Chuang H-S, Wereley ST. In-vitro wall shear stress measurements for microfluid flows by using second-order SPE micro-PIV. In Micro and Nano Systems. American Society of Mechanical Engineers (ASME). 2007. p. 697-703. (ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)). https://doi.org/10.1115/IMECE200741171