TY - GEN
T1 - Incremental mining with prelarge trees
AU - Lin, Chun Wei
AU - Hong, Tzung Pei
AU - Lu, Wen Hsiang
AU - Chien, Been Chian
PY - 2008/8/5
Y1 - 2008/8/5
N2 - In the past, we proposed a Fast Updated FP-tree (FUFP-tree) structure to efficiently handle new transactions and to make the tree-update process become easy. In this paper, we propose the structure of prelarge trees to incrementally mine association rules based on the concept of pre-large itemsets. Due to the properties of pre-large concepts, the proposed approach does not need to rescan the original database until a number of new transactions have been inserted. Experimental results also show that the proposed approach has a good performance for incrementally handling new transactions.
AB - In the past, we proposed a Fast Updated FP-tree (FUFP-tree) structure to efficiently handle new transactions and to make the tree-update process become easy. In this paper, we propose the structure of prelarge trees to incrementally mine association rules based on the concept of pre-large itemsets. Due to the properties of pre-large concepts, the proposed approach does not need to rescan the original database until a number of new transactions have been inserted. Experimental results also show that the proposed approach has a good performance for incrementally handling new transactions.
UR - http://www.scopus.com/inward/record.url?scp=48349118859&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=48349118859&partnerID=8YFLogxK
U2 - 10.1007/978-3-540-69052-8_18
DO - 10.1007/978-3-540-69052-8_18
M3 - Conference contribution
AN - SCOPUS:48349118859
SN - 354069045X
SN - 9783540690450
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 169
EP - 178
BT - New Frontiers in Applied Artificial Intelligence - 21st International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2008, Proceedings
T2 - 21st International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2008
Y2 - 18 June 2008 through 20 June 2008
ER -