Influence of growth orientation on the exchange bias in epitaxial CoMn/Ni80Fe20 films

J. C.A. Huang, H. C. Chiu

Research output: Contribution to journalConference article

3 Citations (Scopus)

Abstract

Exchange coupling effect has been studied in the as-deposited (1 1 1), twinned (1 1 0) and (2 1 1) oriented CoMn/Ni80Fe20 films grown on Mo or Pt seeding layer by molecular beam epitaxy. Uniaxial magnetic anisotropy was observed in all cases mainly due to the epitaxial strain between the Ni80Fe20 and seeding layers. We observed that the exchange bias field (coercivity) is relatively large (small) for the (1 1 1) oriented CoMn/Ni80Fe20 film compared to those of the twinned (1 1 0) and (2 1 1) samples. The orientational dependence of the exchange coupling effect in the as-deposited CoMn/Ni80Fe20 film is very similar to that of the FeMn/Ni80Fe20, where uncompensate plane seems not required for significant exchange bias effect, in marked contrast to the case of PtMn/Ni80Fe20.

Original languageEnglish
Pages (from-to)106-109
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume209
Issue number1-3
DOIs
Publication statusPublished - 2000 Feb
EventProceedings of the 1999 International Symposium on Advanced Magnetic Technologies (ISAMT'99) - Taipei, Taiwan
Duration: 1999 May 241999 May 25

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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